High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy

Andreas Neff; Olga Naumov; Timna-Josua Kühn; Nils Weber; Michael Merkel; Bernd Abel; Aron Varga; Katrin R. Siefermann

doi:doi:10.11648/j.nano.s.2014020601.14

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High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy

Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, Bernd Abel, Aron Varga, Katrin R. Siefermann

Published in American Journal of Nano Research and Applications (Volume 2, Issue 6-1)

Received: 15 November 2014 Accepted: 19 November 2014 Published: 23 December 2014

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Abstract

Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.

Published in	American Journal of Nano Research and Applications (Volume 2, Issue 6-1) This article belongs to the Special Issue Advanced Functional Materials
DOI	10.11648/j.nano.s.2014020601.14
Page(s)	27-33
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2014. Published by Science Publishing Group

Keywords

Photoemission Electron Microscopy, PEEM, Carbon Nanotube, CNT, High Resolution Imaging, Contrast Mechanisms

References

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APA Style

Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, et al. (2014). High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. American Journal of Nano Research and Applications, 2(6-1), 27-33. https://doi.org/10.11648/j.nano.s.2014020601.14

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ACS Style

Andreas Neff; Olga Naumov; Timna-Josua Kühn; Nils Weber; Michael Merkel, et al. High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. Am. J. Nano Res. Appl. 2014, 2(6-1), 27-33. doi: 10.11648/j.nano.s.2014020601.14

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AMA Style

Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, et al. High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. Am J Nano Res Appl. 2014;2(6-1):27-33. doi: 10.11648/j.nano.s.2014020601.14

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@article{10.11648/j.nano.s.2014020601.14,
  author = {Andreas Neff and Olga Naumov and Timna-Josua Kühn and Nils Weber and Michael Merkel and Bernd Abel and Aron Varga and Katrin R. Siefermann},
  title = {High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy},
  journal = {American Journal of Nano Research and Applications},
  volume = {2},
  number = {6-1},
  pages = {27-33},
  doi = {10.11648/j.nano.s.2014020601.14},
  url = {https://doi.org/10.11648/j.nano.s.2014020601.14},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.nano.s.2014020601.14},
  abstract = {Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.},
 year = {2014}
}

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TY  - JOUR
T1  - High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy
AU  - Andreas Neff
AU  - Olga Naumov
AU  - Timna-Josua Kühn
AU  - Nils Weber
AU  - Michael Merkel
AU  - Bernd Abel
AU  - Aron Varga
AU  - Katrin R. Siefermann
Y1  - 2014/12/23
PY  - 2014
N1  - https://doi.org/10.11648/j.nano.s.2014020601.14
DO  - 10.11648/j.nano.s.2014020601.14
T2  - American Journal of Nano Research and Applications
JF  - American Journal of Nano Research and Applications
JO  - American Journal of Nano Research and Applications
SP  - 27
EP  - 33
PB  - Science Publishing Group
SN  - 2575-3738
UR  - https://doi.org/10.11648/j.nano.s.2014020601.14
AB  - Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.
VL  - 2
IS  - 6-1
ER  -

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Author Information

Andreas Neff

Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany
Olga Naumov

Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany
Timna-Josua Kühn

FOCUS GmbH, Neukirchner Strasse 2, 65510 Hünstetten, Germany
Nils Weber

FOCUS GmbH, Neukirchner Strasse 2, 65510 Hünstetten, Germany
Michael Merkel

FOCUS GmbH, Neukirchner Strasse 2, 65510 Hünstetten, Germany
Bernd Abel

Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany
Aron Varga

Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany
Katrin R. Siefermann

Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany

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Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, et al. (2014). High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. American Journal of Nano Research and Applications, 2(6-1), 27-33. https://doi.org/10.11648/j.nano.s.2014020601.14

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ACS Style

Andreas Neff; Olga Naumov; Timna-Josua Kühn; Nils Weber; Michael Merkel, et al. High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. Am. J. Nano Res. Appl. 2014, 2(6-1), 27-33. doi: 10.11648/j.nano.s.2014020601.14

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AMA Style

Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, et al. High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. Am J Nano Res Appl. 2014;2(6-1):27-33. doi: 10.11648/j.nano.s.2014020601.14

Copy | Download

@article{10.11648/j.nano.s.2014020601.14,
  author = {Andreas Neff and Olga Naumov and Timna-Josua Kühn and Nils Weber and Michael Merkel and Bernd Abel and Aron Varga and Katrin R. Siefermann},
  title = {High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy},
  journal = {American Journal of Nano Research and Applications},
  volume = {2},
  number = {6-1},
  pages = {27-33},
  doi = {10.11648/j.nano.s.2014020601.14},
  url = {https://doi.org/10.11648/j.nano.s.2014020601.14},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.nano.s.2014020601.14},
  abstract = {Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.},
 year = {2014}
}

Copy | Download

TY  - JOUR
T1  - High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy
AU  - Andreas Neff
AU  - Olga Naumov
AU  - Timna-Josua Kühn
AU  - Nils Weber
AU  - Michael Merkel
AU  - Bernd Abel
AU  - Aron Varga
AU  - Katrin R. Siefermann
Y1  - 2014/12/23
PY  - 2014
N1  - https://doi.org/10.11648/j.nano.s.2014020601.14
DO  - 10.11648/j.nano.s.2014020601.14
T2  - American Journal of Nano Research and Applications
JF  - American Journal of Nano Research and Applications
JO  - American Journal of Nano Research and Applications
SP  - 27
EP  - 33
PB  - Science Publishing Group
SN  - 2575-3738
UR  - https://doi.org/10.11648/j.nano.s.2014020601.14
AB  - Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.
VL  - 2
IS  - 6-1
ER  -

Copy | Download